Talanin V.I., Talanin I.E. The diffusion model of grown-in microdefects formation during crystallization of dislocation-free silicon single crystals // Advances in Crystallization Processes / Ed. Y. Mastai. – Rijeka: INTECH Publ., 2012. – P. 611-632.

The main aspects of the diffusion model for the formation of grown-in microdefects in dislocation-free silicon single crystals are presented.